Semitronix Tester

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OVERVIEW:

Semitronix Tester– Semitronix’s powerful Fast Parametric Tester – has the capacity to provide users with consistently accurate and high-speed test solutions for rapid process monitoring. Semitronix Tester enables engineers to dramatically reduce the test time for DC measurements in advanced semiconductor wafer manufacturing processes, especially when combined with Semitronix’s addressable test chip solutions.

MAIN FEATURES:

  • Provide users with consistently accurate and high-speed solutions for better process monitoring;
  • Offer two operation modes: online and offline;
  • Algorithms created in TCL for convenient editing and debugging;
  • Enable engineers to change the details of test plan based on the results of previous tests;
  • Provide a convenient method of controlling wafer probers, and specifying test frame execution flow;
  • Compatible with industry standard wafer probers.

MAJOR BENEFITS:

  • >10X faster than common parametric tester for addressable array testing;
  • Proven fast measurement solution for addressable test chips;
  • Parallel testing capability to further reduce test time and lower test cost;
  • Greatly simplified control of test systems and wafer probers in production environment;
  • Intelligent software environment.
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