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Semitronix and Anchor co-host 2015 technical seminar in Shanghai Time:2016-06-03 Click:426

On May 29, Semitronix and Anchor Semiconductor co-hosted the Technical Symposium China 2015 in Shanghai, China. Many semiconductor companies including SMIC, HLMC, HHNEC, CSMC, HISI and etc, attended the event.

The Technical Symposium topics included two parts: Anchor—Pattern Centric Solutions for Yield, Semitronix—Test chip and Yield management for IC Design and manufacturing. In the conference, Anchor unveiled the latest cutting-edge product—Die to Database Pattern Monitor (D2DB-PM), apart from this, Anchor also showcased some of the success stories from fabs. Semitronix introduced a suite of smart test chip product platform for yield improvement; semitronix’s solutions can both apply to fab and fabless, so we invited technical experts from SMIC and HISI to show the success case in foundry and faless.

The Technical Symposium provided a communication platform for IC manufactures, IC design house, and yield improvement solution providers. The attendees’ feedback was very positive and gave high praise on Semitronix’s and Anchor’s technical solution and products, we also benefit a lot from some useful ideas and advices put forwarded by some guests in the discussion time.