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DataExp® – Semitronix’s powerful WAT and test chip data analyzing tool - provides very convenient data filtering and selection operations, powerful plotting functions and auto-report function; users can easily explore specified data and quickly build various plots to create WAT/In-line data analyzing reports.

MAIN FEATURES • User friendly GUI for data filtering and plotting
• Flexible data exploring functions with 3 levels of data filtering
• Supports user defined output, which includes statistic calculations such as mean, median, stdev, CP/CPK, as well as skew, outlier, yield, IDU, and gap calculations
• Supports various plots such as box plot, wafer map, correlation plot, CDF plot, yield plot, fail rate plot
• Highly reusable and data independent plot configuration
• Supports both WAT and In-line data analyzing
• Convenient failure spec and attribute editing
• Flexible process split analysis
• Powerful auto data loading and auto-report function for generating report in PowerPoint format by a few keystrokes, and sending out reports in email
MAJOR BENEFITS • Greatly reduces human labor for WAT and test chip data analyzing
• Includes critical area based fail rate plots, which can be directly used for product yield models
• Easy and fast migration between different products or processes

Main GUI of DataExp®

Benefits of DataExp®